2024 • Conference Paper
Stochastic Nonlinear Dynamical Modelling of SRAM Bitcells in Retention Mode
Authors:
Van Brandt, Léopold,
Flandre, Denis,
Delvenne, Jean-Charles
Published in:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
SRAM bitcells in retention mode behave as autonomous stochastic nonlinear dynamical systems. From observation of variability-aware transient noise simulations, we provide an unidimensional model, fully characterizable by conventional deterministic SPICE simulations, insightfully explaining the mechanism of intrinsic noise-induced bit flips. The proposed model is exploited to, first, explain the reported inaccuracy of existing closed-form near-equilibrium formulas aimed at predicting the mean time to failure and, secondly, to propose a closer estimate attractive in terms of CPU time.