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2026-02-12 (13:00) : Mixed-signal neuromorphic circuits and systems for extreme-edge computing

At Nyquist

Organized by Electrical Engineering

Speaker : Dr. Ariana Rubino (ETH Zurich)
Abstract : Brain-inspired computing architectures offer a promising solution for integrating Internet of Things (IoT) sensors with intelligent local processing in edge computing applications. In particular, mixed-signal event-based neuromorphic designs inherently meet key requirements of edge computing: power efficiency, compactness, low latency, real-time processing, and adaptability via on-chip learning. Despite these advantages, several challenges remain. These include the development of powerful and effective spike-based learning mechanisms, the adoption of advanced Complementary metal-oxide-semiconductors (CMOS) technology nodes, and the significant silicon area required to implement neural dynamics with long time constants and synaptic plasticity. In my talk, I will showcase the research conducted during my PhD to advance the state of the art in mixed-signal neuromorphic processors for edge computing. In particular, I will highlight the potential of multi-compartment neuron models to enable dendritic spike-based learning rules driven by target activities - an approach well suited to compact and resource constrained edge devices. To support the development of more compact and low-power systems, and to address the limitations of scaled bulk-CMOS technologies, I will present our investigation into Fully Depleted-Silicon on Insulator (FDSOI) transistor technology for neuromorphic circuit design, demonstrating improved energy efficiency, reduced mismatch, and better support for long synaptic dynamics. Finally, to further optimize compactness at the synaptic array, I will discuss emerging memory technologies, with a focus on energy-efficient edge-compatible Ferroelectric Tunneling Junction (FTJ) memristive synapses. For each of these three aspects, I will present the mixed-signal neuromorphic processors I designed and/or contributed to - ranging from prototype test platforms to large-scale multi-core architectures - along with both circuit-level simulation results and chip-level measurement data.
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